ORGN 609 |
| Redox-gradient dendrimers (RGDs) were cast onto thin films (2-10nm) by vapor deposition and spin coating onto SiO2/Si and other substrates. Charging of local regions by atomic force microscopy (AFM) was accomplished by application of a tip bias voltage at a metal-coated AFM probe. The resulting film surface morphology was monitored by tapping AFM and surface potential mapped by scanning Kelvin probe microscopy (KPM). Charge evolution in time and space was monitored for varied substrates and RGD films to develop and optimize a charge storage system. |
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Materials, Devices, and Switches
8:00 AM-12:00 PM, Thursday, 30 March 2006 Georgia World Congress Center -- Georgia Ballroom 2, Oral
Division of Organic Chemistry |